Material recognition in the wild with the Materials in Context Database

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 07-12-June-2015, Issue , 2015, Pages 3479-3487

  Bell, Sean ^a   Upchurch, Paul ^a   Snavely, Noah ^a   Bala, Kavita ^a  

^a Cornell University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; CONVOLUTION; DATABASE SYSTEMS; IMAGE SEGMENTATION; NEURAL NETWORKS; RANDOM PROCESSES;

CONDITIONAL RANDOM FIELD; CONVOLUTIONAL NEURAL NETWORK; DEEP LEARNING; LIGHTING CONDITIONS; MATERIAL DATABASE; MATERIAL RECOGNITION; REAL-WORLD IMAGE; SURFACE TEXTURES;

PATTERN RECOGNITION;

EID: 84959212440     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2015.7298970     Document Type: Conference Paper

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