QTL mapping of flag leaf traits in common wheat using an integrated high-density SSR and SNP genetic linkage map

Euphytica

Volumn 208, Issue 2, 2016, Pages 337-351

  Wu, Qiuhong ^a   Chen, Yongxing ^a   Fu, Lin ^a   Zhou, Shenghui ^a   Chen, Jiaojiao ^a   Zhao, Xiaojie ^a   Zhang, Dong ^a   Ouyang, Shuhong ^a   Wang, Zhenzhong ^a   Li, Dan ^a   Wang, Guoxin ^a   Zhang, Deyun ^a   Yuan, Chengguo ^a,b   Wang, Lixin ^c   You, Mingshan ^a   Han, Jun ^d   Liu, Zhiyong ^a  

^a CHINA AGRICULTURAL UNIVERSITY   (China)

^b Gaoyi Stock Seed Farm ^*  (China)

^c INSTITUTE OF PLANT AND ENVIRONMENT PROTECTION   (China)

^d BEIJING UNIVERSITY OF AGRICULTURE   (China)

Author keywords

Awn; Flag leaf; QTL mapping; SNP; SSR; Wheat

Indexed keywords

EID: 84959147825     PISSN: 00142336     EISSN: 15735060     Source Type: Journal    
DOI: 10.1007/s10681-015-1603-0     Document Type: Article

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