Fine mapping TaFLW1, a major QTL controlling flag leaf width in bread wheat (Triticum aestivum L.)

Theoretical and Applied Genetics

Volumn 126, Issue 8, 2013, Pages 1941-1949

  Xue, Shulin ^a   Xu, Feng ^a   Li, Guoqiang ^a   Zhou, Yan ^a   Lin, Musen ^a   Gao, Zhongxia ^a   Su, Xiuhong ^a   Xu, Xiaowu ^a   Jiang, Ge ^a   Zhang, Shuang ^a   Jia, Haiyan ^a   Kong, Zhongxin ^a   Zhang, Lixia ^a   Ma, Zhengqiang ^a  

^a NANJING AGRICULTURAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BIN MAPPING; FUSARIUM HEAD BLIGHT RESISTANCES; MAP-BASED CLONING; MARKER-ASSISTED SELECTION; NEAR-ISOGENIC LINES; PHOTOSYNTHETIC CAPACITY; RECOMBINANT INBRED LINES; YIELD POTENTIAL;

CHROMOSOMES;

PLANTS (BOTANY);

FUSARIUM; TRITICUM AESTIVUM;

ARTICLE; BREAD; CHROMOSOME MAP; DISEASE RESISTANCE; FUSARIUM; GENE DELETION; GENETIC LINKAGE; GENETIC MARKER; GENETIC VARIABILITY; GENETICS; GENOTYPE; HISTOLOGY; IMMUNOLOGY; INNATE IMMUNITY; MICROBIOLOGY; PLANT CHROMOSOME; PLANT DISEASE; PLANT LEAF; QUANTITATIVE TRAIT LOCUS; WHEAT;

BREAD; CHROMOSOME MAPPING; CHROMOSOMES, PLANT; DISEASE RESISTANCE; FUSARIUM; GENE DELETION; GENETIC LINKAGE; GENETIC MARKERS; GENETIC VARIATION; GENOTYPE; IMMUNITY, INNATE; PLANT DISEASES; PLANT LEAVES; QUANTITATIVE TRAIT LOCI; TRITICUM;

EID: 84880842508     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00122-013-2108-7     Document Type: Article

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