QTLs for flag leaf size and their influence on yield-related traits in wheat (Triticum aestivum L.)

Molecular Breeding

Volumn 35, Issue 1, 2015, Pages

  Fan, Xiaoli ^a,b   Cui, Fa ^a,c   Zhao, Chunhua ^a,c   Zhang, Wei ^a,c   Yang, Lijuan ^d   Zhao, Xueqiang ^c   Han, Jie ^b   Su, Qiannan ^b   Ji, Jun ^a,c   Zhao, Zongwu ^d   Tong, Yiping ^c   Li, Junming ^a,c  

^a INSTITUTE OF GENETICS AND DEVELOPMENTAL BIOLOGY   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^d The Xinxiang Academy of Agriculture Sciences   (China)

Author keywords

Conditional QTL mapping; Flag leaf related traits; Quantitative trait locus; Wheat; Yield potential

Indexed keywords

MAPPING; NITROGEN; PLANTS (BOTANY);

CONDITIONAL QUANTITATIVE TRAIT LOCUS MAPPING; FLAG LEAF-RELATED TRAIT; MAPPING ANALYSIS; PLANT ARCHITECTURE; QUANTITATIVE TRAIT LOCI MAPPINGS; QUANTITATIVE TRAIT LOCUS; RECOMBINANT INBRED LINES; WHEAT; WHEAT (TRITICUM AESTIVUM L.); YIELD POTENTIAL;

CHROMOSOMES;

TRITICUM AESTIVUM;

EID: 84921341400     PISSN: 13803743     EISSN: 15729788     Source Type: Journal    
DOI: 10.1007/s11032-015-0205-9     Document Type: Article

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