Analog CMOS integrated circuits for high-temperature operation with leakage current compensation

1998 4th International High Temperature Electronics Conference, HITEC 1998

Volumn , Issue , 1998, Pages 41-44

  Mizuno, K ^a   Ohta, N ^a   Kitagawa, F ^a   Nagase, H ^a  

^a Rd Management Section   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG INTEGRATED CIRCUITS; HIGH TEMPERATURE OPERATIONS; TIMING CIRCUITS;

CMOS ANALOG INTEGRATED CIRCUITS; COMPENSATION CIRCUITS; CURRENT COMPENSATION; OPERATING TEMPERATURE; P-N JUNCTION; VOLTAGE REFERENCE;

CMOS INTEGRATED CIRCUITS;

EID: 85029454356     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HITEC.1998.676758     Document Type: Conference Paper

References (2)

1. F. S. Shoucair, "Potential and problems of high-temperature electronics and CMOS integrated circuits(25-250°C )-an overview", Microelectron Journal Vol. 22 No. 2 1991
2. A. S. Grove, "Physics and Technology of Semiconductor Devices", John Wiley & Sons, Inc.