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Volumn 9592, Issue , 2015, Pages

X-ray microscopy for in situ characterization of 3D nanostructural evolution in the laboratory

Author keywords

In situ; Load stage; Mechanical testing; Micro CT; Nano CT; X ray Microscopy

Indexed keywords

COMPUTERIZED TOMOGRAPHY; LABORATORIES; LOAD TESTING; MECHANICAL TESTING; METAL TESTING; NANOTECHNOLOGY; X RAY MICROSCOPES;

EID: 84951067221     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2188728     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.