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Volumn 2000-January, Issue , 2000, Pages D5.1-D5.9

Design of radiation hard CMOS APS image sensors for space applications

Author keywords

CMOS image sensors; CMOS process; Costs; Fabrication; Image sensors; NASA; Pixel; Sensor phenomena and characterization; Sensor systems; Space missions

Indexed keywords

BUDGET CONTROL; CMOS INTEGRATED CIRCUITS; COSTS; DESIGN; FABRICATION; IMAGE SENSORS; INTEGRATED CIRCUIT DESIGN; MICROFABRICATION; NASA; PIXELS; RADIATION; SPACE APPLICATIONS; SPACE FLIGHT;

EID: 84949950499     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NRSC.2000.838967     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 84886670836 scopus 로고
    • Active Pixel Sensors: Are CCD's Dinosaurs?
    • Eric R. Fossum, "Active Pixel Sensors: Are CCD's Dinosaurs?," Proc. SPIE, Vol. 1900 (1993).
    • (1993) Proc. SPIE , vol.1900
    • Fossum, E.R.1
  • 2
    • 0031249402 scopus 로고    scopus 로고
    • CMOS Image Sensors - Electronic Camera on a Chip
    • Eric R. Fossum, "CMOS Image Sensors - Electronic Camera on a Chip," IEEE Trans. on Electronic Devices, Vol. 44, No.10 (1997).
    • (1997) IEEE Trans. on Electronic Devices , vol.44 , Issue.10
    • Fossum, E.R.1
  • 4
    • 0032075387 scopus 로고    scopus 로고
    • Digital Camera System on a Chip
    • Eric R. Fossum, "Digital Camera System on a Chip," IEEE Micro Magazine, Vol. 18, No. 3 (1998).
    • (1998) IEEE Micro Magazine , vol.18 , Issue.3
    • Fossum, E.R.1
  • 5
    • 0033311541 scopus 로고    scopus 로고
    • Radiation Tolerant VLSI Circuits in Standard Deep Submicron CMOS Technologies for the LHC Experiments: Practical Design Aspects
    • Norfolk, Virginia, USA
    • G. Anelli et al., "Radiation Tolerant VLSI Circuits in Standard Deep Submicron CMOS Technologies for the LHC Experiments: Practical Design Aspects," Presented at the Thirty-sixth IEEE International Nuclear and Space Radiation Effects Conference, Norfolk, Virginia, USA (1999).
    • (1999) Thirty-sixth IEEE International Nuclear and Space Radiation Effects Conference
    • Anelli, G.1
  • 6
    • 0003967593 scopus 로고    scopus 로고
    • Layout Techniques to Enhance the Radiation Tolerance of Standard CMOS Technologies Demonstrated on a Pixel Readout Chip
    • Schloss Elmau, Germany
    • W. Snoeys et al., "Layout Techniques to Enhance the Radiation Tolerance of Standard CMOS Technologies Demonstrated on a Pixel Readout Chip," Presented at the Eighth European Symposium on Semiconductor Detectors, Schloss Elmau, Germany (1998).
    • (1998) Eighth European Symposium on Semiconductor Detectors
    • Snoeys, W.1
  • 7
    • 84939068629 scopus 로고
    • Generation of Interface States by Ionizing Radiation in Very Thin MOS Oxides
    • Nelson Saks, Mario Ancona, and John Modolo, "Generation of Interface States by Ionizing Radiation in Very Thin MOS Oxides," IEEE Trans. on Nuclear Science, Vol. 33, No. 6 (1986).
    • (1986) IEEE Trans. on Nuclear Science , vol.33 , Issue.6
    • Saks, N.1    Ancona, M.2    Modolo, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.