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Volumn 15, Issue 12, 2015, Pages 30165-30186

Abnormal condition monitoring of Workpieces based on RFID for wisdom manufacturing workshops

Author keywords

Complex event processing (CEP); Data cleaning; Data mining; Radio frequency identification (RFID); Wisdom manufacturing

Indexed keywords

CLEANING; CONDITION MONITORING; DATA MINING; LIFE CYCLE; MANUFACTURE; MANUFACTURING DATA PROCESSING; RADIO WAVES;

EID: 84949292618     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s151229789     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.