Research on supply chain abnormal event detection based on the RFID technology

Applied Mechanics and Materials

Volumn 513-517, Issue , 2014, Pages 3309-3312

  Huang, Shun Ping ^a   Wang, Dong ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Abnormal detection; Machine learning; RFID

Indexed keywords

ABNORMAL DETECTION; ABNORMAL EVENT DETECTIONS; EVENTS DETECTION; HIGH LEVEL APPLICATIONS; MACHINE LEARNING METHODS; PATH MINING; RFID TECHNOLOGY; SUPPLY NETWORKS;

COMPLEX NETWORKS; LEARNING SYSTEMS; MATERIALS SCIENCE; RADIO FREQUENCY IDENTIFICATION (RFID); SUPPLY CHAINS;

INFORMATION TECHNOLOGY;

EID: 84897676725     PISSN: 16609336     EISSN: 16627482     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMM.513-517.3309     Document Type: Conference Paper

References (8)

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