Symmetry realization of BSIM model with dynamic reference method for circuit simulation

Device Research Conference - Conference Digest, DRC

Volumn 2002-January, Issue , 2002, Pages 65-66

  Xi, Xuemei ^a   Cao, Kanyu ^a   He, Jin ^a   Wan, Hui ^a   Chan, Mansun ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Circuit simulation; Circuit testing; Equations; Forward contracts; Mathematical model; MOS devices; MOSFET circuits; Resistors; Virtual manufacturing; Voltage

Indexed keywords

AGILE MANUFACTURING SYSTEMS; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT TESTING; MATHEMATICAL MODELS; MOS DEVICES; MOSFET DEVICES; RESISTORS;

CIRCUIT TESTING; EQUATIONS; FORWARD CONTRACT; MOSFET CIRCUITS; VIRTUAL MANUFACTURING;

CIRCUIT SIMULATION;

EID: 84948652376     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2002.1029514     Document Type: Conference Paper

References (5)

1. Y.Cheng, etal, IEEE ED,vol.44,pp.277, 1997
2. N.D.Arora, etal, IEEE ED, vol.41,pp.988,1994
3. K.Kuntal, etal, IEEE ED, vol.45, pp.134, 1998
4. A.R.Boothroyd, etal, IEEE ED, vol.38.pp.1512,1991
5. N.D.Arora, IEICE Trans. Electron, vol.E82-c, pp967, 1999