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Volumn 54, Issue 38, 2015, Pages 11162-11167

Definitive Molecular Level Characterization of Defects in UiO-66 Crystals

Author keywords

metal organic frameworks; single crystals; structure elucidation; UiO 66; X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; HYDROGEN BONDS; METAL-ORGANIC FRAMEWORKS; MOLECULES; ORGANOMETALLICS; SINGLE CRYSTALS; X RAY DIFFRACTION; ZIRCONIUM; ZIRCONIUM METALLOGRAPHY;

EID: 84945245491     PISSN: 14337851     EISSN: 15213773     Source Type: Journal    
DOI: 10.1002/anie.201505461     Document Type: Article
Times cited : (395)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.