Effect of ESD transients on noise in GMR recording heads

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2003-January, Issue , 2003, Pages

  Baril, Lydia ^a   Wallash, Albert ^a   Guarisco, Davide ^a  

^a MAXTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DISCHARGE; RECORDING INSTRUMENTS; TRANSIENTS;

BARKHAUSEN JUMPS; MAGNETIC NOISE; NOISE SOURCE; NOISE SPECTRA; RECORDING HEAD; SOURCE OF NOISE;

ELECTROSTATIC DEVICES;

EID: 84945232235     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. Bert Perry, 'ESD Damage Threshold: history and prognosis' EOS/ESD Symposium 00-318
2. N. Smith and P. Arnett, 'White noise magnetization fluctuations in magneto resistive heads', Appl Phys Lett 78, 1448 (2001)
3. Alexey V. Nazarov, Hae Seok Cho, Janusz Nowak, Scott Stokes and Ned Tabat, 'Tunable ferromagnetic resonance peak in tunneling magneto resistive sensor structures', App. Physics Lett. Vol 81, 24 (2002) p4559
4. Takehiko Hamaguchi, Takayuki Ichihara and Takayoshi Ohtsu, 'Analysis of Barkhausen Noise Failure Caused by ESD in a GMR Head' EOS/ESD Symposium 2002, p.119.
5. H.T. Hardner, M.B. Weissman, M. B. Salamon and S. S. P. Parkin, "Fluctuation-dissipation relation for giant magnetoresistive 1/f noise", Physical Review B, Vol 48, number 21, dec 1993 pp 16156-16159
6. Paper DD-02 from Intermag 2003, from Jian-Gang Zhu, Yuchen Zhou, Nayoung Kim, to be published
7. paper DD-03 from Intermag 2003, from Stephen E. Russek, Pavel Kabos, Bill Cross, to be published
8. Lydia Baril, Mark Nichols and Albert Wallash, "Degradation of GMR and TMR Recording Heads Using very short duration ESD Transients", IEEE Trans. Magn. Vol. 38 (2002) 2283-2285
9. K. B. Klaassen, J. C. L. Van Peppen and X. Xing, Noise in magnetic tunnel junction devices, J. Appl. Physics Vol 93, number 10, May 2003, pp 8573-8575