Analysis of Barkhausen noise failure caused by ESD in a GMR head

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 119-122

  Hamaguchi, Takehiko ^a   Ichihara, Takayuki ^a   Ohtsu, Takayoshi ^a  

^a HITACHI LTD   (Japan)

Author keywords

Circuit noise; Circuit simulation; Electrostatic discharge; Failure analysis; Giant magnetoresistance; Magnetic analysis; Magnetic circuits; Magnetic domain walls; Magnetic heads; Magnetic noise

Indexed keywords

AMPLIFIERS (ELECTRONIC); CIRCUIT SIMULATION; DOMAIN WALLS; ELECTRIC NETWORK ANALYSIS; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; GIANT MAGNETORESISTANCE; MAGNETIC CIRCUITS; MAGNETIC DOMAINS; MAGNETIC HEADS; MAGNETISM; WALLS (STRUCTURAL PARTITIONS);

BARKHAUSEN NOISE; CIRCUIT NOISE; ESD SIMULATORS; GIANT MAGNETORESISTIVE HEADS; MACHINE MODELING; MAGNETIC ANALYSIS; MAGNETIC NOISE; PINNED LAYERS;

FAILURE ANALYSIS;

EID: 84948768761     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Albert J.Wallash, "Standardized ESD Test for Magnetoresistive Recording Heads," IEEE Trans. Magn., Vol. 33. No. 5, 2911-2913 (1997).
2. M.Takahashi, T.Maeda, K.Inage, M.Sakai, H.Morita, and M.Matsuzaki, "ESD Induced Pinned Layer Reversal in Spin-Valve GMR Heads," IEEE Trans. Magn., Vol. 34. No.4, 1522-1524 (1998).