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Volumn 1, Issue , 2003, Pages 829-832
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Post-enabled flip-chip assembly for manufacturable RF-MEMS
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Author keywords
Assembly; Capacitance measurement; Capacitors; Circuit testing; Fabrication; Foundries; Manufacturing; Q factor; Radio frequency; Radiofrequency microelectromechanical systems
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Indexed keywords
ACTUATORS;
ASSEMBLY;
CAPACITANCE;
CAPACITANCE MEASUREMENT;
CAPACITORS;
CHIP SCALE PACKAGES;
ELECTROMECHANICAL DEVICES;
ELECTRONICS PACKAGING;
FABRICATION;
FOUNDRIES;
MANUFACTURE;
MEMS;
MICROSYSTEMS;
Q FACTOR MEASUREMENT;
SOLID-STATE SENSORS;
TRANSDUCERS;
CAPACITANCE RATIO;
CAPACITIVE PERFORMANCE;
CIRCUIT TESTING;
FLIP CHIP ASSEMBLIES;
Q-FACTORS;
RADIO FREQUENCIES;
RF PERFORMANCE;
VARIABLE CAPACITOR;
FLIP CHIP DEVICES;
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EID: 84944750808
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2003.1215602 Document Type: Conference Paper |
Times cited : (1)
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References (7)
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