High-throughput determination of structural phase diagram and constituent phases using GRENDEL

Nanotechnology

Volumn 26, Issue 44, 2015, Pages

  Kusne, A G ^a   Keller, D ^b   Anderson, A ^b   Zaban, A ^b   Takeuchi, I ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b BAR ILAN UNIVERSITY   (Israel)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

high throughput materials science; materials informatics; phase diagram

Indexed keywords

CHARACTERIZATION; CRYSTAL STRUCTURE; DATA HANDLING; GRAPHIC METHODS; INFORMATION ANALYSIS; PHASE DIAGRAMS; X RAY DIFFRACTION;

COMBINATORIAL LIBRARY; ENDMEMBER EXTRACTION; HIGH-THROUGHPUT MATERIALS; HIGH-THROUGHPUT METHOD; INORGANIC CRYSTAL STRUCTURE DATABASE; MATERIALS INFORMATICS; STRUCTURAL PHASE DIAGRAMS; X-RAY DIFFRACTION DATA;

THROUGHPUT;

EID: 84944340073     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/26/44/444002     Document Type: Article

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