Rapid identification of structural phases in combinatorial thin-film libraries using x-ray diffraction and non-negative matrix factorization

Review of Scientific Instruments

Volumn 80, Issue 10, 2009, Pages

  Long, C J ^a   Bunker, D ^b   Li, X ^b   Karen, V L ^b   Takeuchi, I ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL MATERIALS; COMPOSITION SPREAD; NONNEGATIVE MATRIX FACTORIZATION; PRINCIPLE COMPONENT ANALYSIS; RAPID IDENTIFICATION; REFERENCE PATTERNS; STRUCTURAL PATTERN; STRUCTURAL PHASIS; X RAY MICRODIFFRACTION; XRD; XRD PATTERNS;

BLIND SOURCE SEPARATION; DIFFRACTION; FACTORIZATION; GALLIUM; HOLOGRAPHIC INTERFEROMETRY; LIGHT MEASUREMENT; PALLADIUM; TERNARY SYSTEMS; X RAY DIFFRACTION ANALYSIS;

X RAY DIFFRACTION;

EID: 70350761965     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3216809     Document Type: Article

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