X-ray patterned deposition of gold nanoparticles from solution

Proceedings of the International Semiconductor Conference, CAS

Volumn 1, Issue , 2003, Pages 39-42

  Divan, R ^a   Mancini, D C ^a   Moldovan, N ^a,b   Assoufid, L ^a   Chu, Y S ^a   Ma, Q ^a   Rosenberg, R A ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Artificial intelligence; Atomic force microscopy; Filters; Gold; Magnetic separation; Mirrors; Nanoparticles; Silicon compounds; Synchrotron radiation; X ray diffraction

Indexed keywords

ARTIFICIAL INTELLIGENCE; ATOMIC FORCE MICROSCOPY; DEPOSITION; FIBER OPTIC SENSORS; FILTERS (FOR FLUIDS); GOLD; MAGNETIC SEPARATION; METAL NANOPARTICLES; MIRRORS; NANOPARTICLES; SILICON COMPOUNDS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION;

DEPOSITION CONDITIONS; DEPOSITION OF GOLD NANOPARTICLES; FILM MORPHOLOGY; GRAIN SIZE; HIGH ENERGY SYNCHROTRON; PATTERNED DEPOSITION; PREFERRED ORIENTATIONS; SOLUTION CHEMISTRY;

NANOMAGNETICS;

EID: 84944324313     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMICND.2003.1251340     Document Type: Conference Paper

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