Innovative measurement of parallelism for parallel transparent plate based on optical scanning holography by using a random-phase pupil

Applied Optics

Volumn 54, Issue 9, 2015, Pages 2483-2488

  Luo Zhi, Zhang ^a   Jian Ping, Hu ^b   Dao Ming, Wan ^a   Xing, Zeng ^a   Chun Miao, Li ^a   Xin, Zhou ^a  

^a SICHUAN UNIVERSITY   (China)

^b CHENGDU FINE OPTICAL ENGINEERING RESEARCH CENTER   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLOGRAPHY; IMAGE RECONSTRUCTION; NUMERICAL METHODS; SCANNING;

INTERFERENCE FRINGE; INTERFERENCE METHODS; LOCAL MEAN; LOWER LIMITS; PARALLEL PLATES; POTENTIAL METHODS; QUALITY OF RECONSTRUCTED IMAGES; RANDOM-PHASE;

MEAN SQUARE ERROR;

EID: 84942368111     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.54.002483     Document Type: Article

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