Measurement of parallelism of the surfaces of a transparent sample

Optics and Lasers in Engineering

Volumn 35, Issue 1, 2001, Pages 27-31

  Bhattacharya, J C ^a  

^a CSIR CENTRAL SCIENTIFIC INSTRUMENTS ORGANISATION   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; INTERFEROMETRY; LASER OPTICS; REFRACTIVE INDEX;

LAU EFFECT;

TRANSPARENCY;

EID: 0034817733     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(00)00102-0     Document Type: Article

References (5)

1. The optical industry and systems encyclopaedia and dictionary, Vol. 2, 1979, p. E-22.
2. Jenkins FA, White HE. Fundamentals of optics, New York: Mcgraw-Hill, 1957, p. 302-4.
3. Lau E. Ann Phys 1948;6:417.
4. Bhattacharya JC. Refractive index measurement. Opt Laser Technol 1987;19:29-32.
5. Patorski K. Incoherent superposition of multiple self-imaging, Lau effect and moire fringe explaination. Optica Acta 1983;30:745-58.