-
1
-
-
84975557386
-
Effect of Spurious Reflection on a Phase Shift Interferometry
-
Ai C. and J.Wyant, "Effect of Spurious Reflection on a Phase Shift Interferometry," Appl. Opt., 27, 3039-3045 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 3039-3045
-
-
Ai, C.1
Wyant, J.2
-
2
-
-
0026978013
-
Absolute Testing of Flats Decomposed to Even and Odd Functions
-
Ai C. and J.C. Wyant, "Absolute Testing of Flats Decomposed to Even and Odd Functions," Proc. SPIE, 1776, 73-83 (1992).
-
(1992)
Proc. SPIE
, vol.1776
, pp. 73-83
-
-
Ai, C.1
Wyant, J.C.2
-
3
-
-
0027639030
-
Effect of Retroreflection on a Phase-Shifting Interferometer
-
Ai C. and J.Wyant, "Effect of Retroreflection on a Phase-Shifting Interferometer," Appl. Opt., 32, 3470-3478 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 3470-3478
-
-
Ai, C.1
Wyant, J2
-
4
-
-
0029493327
-
Fizeau Interferometry for Large Convex Surfaces
-
Burge J. H., "Fizeau Interferometry for Large Convex Surfaces," Proc. SPIE, 2536, 127-138 (1995).
-
(1995)
Proc. SPIE
, vol.2536
, pp. 127-138
-
-
Burge, J.H.1
-
5
-
-
84950324222
-
Advances in Laser Fizeau Inteferometry for Optical Testing
-
Deck L., D. Stephenson, M. Küchel, and C. Evans, "Advances in Laser Fizeau Inteferometry for Optical Testing," TOPS, 76, 108-111 (2000).
-
(2000)
TOPS
, vol.76
, pp. 108-111
-
-
Deck, L.1
Stephenson, D.2
Küchel, M.3
Evans, C.4
-
6
-
-
84975549761
-
A Note on Possible Errors Due to Thickness Variations in Testing Nominally Parallel Plates
-
Forman P. F., "A Note on Possible Errors Due to Thickness Variations in Testing Nominally Parallel Plates," Appl. Opt., 3, 646 (1964).
-
(1964)
Appl. Opt.
, vol.3
, pp. 646
-
-
Forman, P.F.1
-
7
-
-
84957470065
-
The Zygo Interferometer System
-
Forman P. F., "The Zygo Interferometer System," Proc. SPIE, 192, 41 (1979).
-
(1979)
Proc. SPIE
, vol.192
, pp. 41
-
-
Forman, P.F.1
-
8
-
-
0021004318
-
Absolute Calibration of an Optical Flat
-
Fritz B. S., "Absolute Calibration of an Optical Flat," Proc. SPIE, 433, 123 (1983).
-
(1983)
Proc. SPIE
, vol.433
, pp. 123
-
-
Fritz, B.S.1
-
9
-
-
0021468527
-
Absolute Calibration of an Optical Flat
-
Fritz B. S., "Absolute Calibration of an Optical Flat," Opt. Eng., 23, 379 (1984).
-
(1984)
Opt. Eng.
, vol.23
, pp. 379
-
-
Fritz, B.S.1
-
10
-
-
0042933138
-
Use of a Liquid Mirror for the Calibration of an Interferometer
-
Grigor'evV. A.,Va. O. Zaborov, and P. P. Ivanov, "Use of a Liquid Mirror for the Calibration of an Interferometer," Sov. J. Opt. Technol., 53, 613 (1986).
-
(1986)
Sov. J. Opt. Technol.
, vol.53
, pp. 613
-
-
Grigor'ev, V.A.1
Va. Zaborov, O.2
Ivanov, P.P.3
-
11
-
-
84975597847
-
Fringe Localization Depth: A Comment
-
Hariharan P. and W. H. Steel, "Fringe Localization Depth: A Comment," Appl. Opt., 28, 29 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 29
-
-
Hariharan, P.1
Steel, W.H.2
-
12
-
-
0042424838
-
Interferometric Testing in a Precision Optics Shop: A Review of Testplate Testing
-
Karow H. H., "Interferometric Testing in a Precision Optics Shop: A Review of Testplate Testing," Proc. SPIE, 192, 56 (1979).
-
(1979)
Proc. SPIE
, vol.192
, pp. 56
-
-
Karow, H.H.1
-
13
-
-
85075149702
-
Optical Testing With Large Liquid Flats
-
Ketelsen D. A. and D. S. Anderson, "Optical Testing With Large Liquid Flats," Proc. SPIE, 966, 365 (1988).
-
(1988)
Proc. SPIE
, vol.966
, pp. 365
-
-
Ketelsen, D.A.1
Anderson, D.S.2
-
14
-
-
0014764488
-
Testing of Aspherical Surfaces with Newton Fringes
-
Malacara D. and A. Cornejo, "Testing of Aspherical Surfaces with Newton Fringes," Appl.Opt., 9, 837 (1970).
-
(1970)
Appl.Opt.
, vol.9
, pp. 837
-
-
Malacara, D.1
Cornejo, A.2
-
15
-
-
0019035988
-
Direct Measurement of Phase in a SphericalWave Fizeau Interferometer
-
Moore R. C. and F. H. Slaymaker, "Direct Measurement of Phase in a SphericalWave Fizeau Interferometer," Appl. Opt., 19, 2196 (1980).
-
(1980)
Appl. Opt.
, vol.19
, pp. 2196
-
-
Moore, R.C.1
Slaymaker, F.H.2
-
16
-
-
84975562781
-
A Note on the Testing of Large Aperture Plane Parallel Plates of Glass,
-
Murty M. V. R. K., "A Note on the Testing of Large Aperture Plane Parallel Plates of Glass, " Appl. Opt., 2, 1337 (1963).
-
(1963)
Appl. Opt.
, vol.2
, pp. 1337
-
-
Murty, M.V.R.K.1
-
17
-
-
84955092563
-
Addendum to: A Note on the Testing of Large Aperture Plane Parallel Plates of Glass
-
Murty M. V. R. K., "Addendum to: A Note on the Testing of Large Aperture Plane Parallel Plates of Glass," Appl. Opt., 3, 784 (1964a).
-
(1964)
Appl. Opt.
, vol.3
, pp. 784
-
-
Murty, M.V.R.K.1
-
18
-
-
84975568414
-
The Use of a Single Plane Parallel Plate as a Lateral Shearing Interferometer with a Visible Gas Laser Source
-
Murty M. V. R. K., "The Use of a Single Plane Parallel Plate as a Lateral Shearing Interferometer with a Visible Gas Laser Source," Appl. Opt., 3, 531 (1964b).
-
(1964)
Appl. Opt.
, vol.3
, pp. 531
-
-
Murty, M.V.R.K.1
-
19
-
-
84955141948
-
Some Considerations of the Fizeau Interferometer
-
Murty M. V. R. K. and R. P. Shukla, "Some Considerations of the Fizeau Interferometer," Bull. Opt. Soc. India, 4, 13 (1970).
-
(1970)
Bull. Opt. Soc. India
, vol.4
, pp. 13
-
-
Murty, M.V.R.K.1
Shukla, R.P.2
-
20
-
-
0009508279
-
Errors Caused by Nearly Parallel Optical Elements in a Laser Fizeau Interferometer Utilizing Strictly Coherent Imaging
-
Novak E., C, Ai and C.Wyant, "Errors Caused by Nearly Parallel Optical Elements in a Laser Fizeau Interferometer Utilizing Strictly Coherent Imaging," Proc. SPIE, 3134, 456-460 (1997).
-
(1997)
Proc. SPIE
, vol.3134
, pp. 456-460
-
-
Novak, E.1
Ai, C.2
Wyant, C.3
-
21
-
-
0021517827
-
Optical Flatness Standard
-
Primak W., "Optical Flatness Standard," Opt. Eng., 23, 806 (1984).
-
(1984)
Opt. Eng.
, vol.23
, pp. 806
-
-
Primak, W.1
-
22
-
-
84955161878
-
Optical Flatness Standard II: Reduction of Interferograms
-
Primak W., "Optical Flatness Standard II: Reduction of Interferograms," Proc. SPIE, 954, 375 (1989a).
-
(1989)
Proc. SPIE
, vol.954
, pp. 375
-
-
Primak, W.1
-
23
-
-
84894006031
-
Optical Flatness Standard: Comment
-
Primak W., "Optical Flatness Standard: Comment," Opt. Eng., 28, 934 (1989b).
-
(1989)
Opt. Eng.
, vol.28
, pp. 934
-
-
Primak, W.1
-
24
-
-
2442474381
-
Low Cost Method for Subarcsecond Testing of a Right Angle Prism
-
Saxena A. K. and L. Yeswanth, "Low Cost Method for Subarcsecond Testing of a Right Angle Prism," Opt. Eng., 29, 1516-1520 (1990).
-
(1990)
Opt. Eng.
, vol.29
, pp. 1516-1520
-
-
Saxena, A.K.1
Yeswanth, L.2
-
25
-
-
84955091900
-
-
E. Wolf, Ed., North Holland, Amsterdam, Chap. IV
-
Schulz G. and J. Schwider, in Progress in Optics, vol. 13, E. Wolf, Ed., North Holland, Amsterdam, 1976, Chap. IV.
-
(1976)
in Progress in Optics
, vol.13
-
-
Schulz, G.1
Schwider, J.2
-
26
-
-
0023363045
-
Comments on the Paper "Optical Flatness Standard
-
Schulz G. and J. Schwider, "Comments on the Paper "Optical Flatness Standard," Opt. Eng., 26, 559 (1987).
-
(1987)
Opt. Eng.
, vol.26
, pp. 559
-
-
Schulz, G.1
Schwider, J.2
-
27
-
-
0018441769
-
The Shack Interferometer
-
Shack R. V. and G. W. Hopkins, "The Shack Interferometer," Opt. Eng., 18, 226 (1979).
-
(1979)
Opt. Eng.
, vol.18
, pp. 226
-
-
Shack, R.V.1
Hopkins, W.2
-
28
-
-
0000456261
-
Fringe Localization Depth
-
Simon J. M. and S. A. Comatri, "Fringe Localization Depth," Appl. Opt., 26, 5125 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 5125
-
-
Simon, J.M.1
Comatri, S.A.2
-
29
-
-
84937864248
-
Versatile Interferometer for Shop Use
-
Smith W. S., "Versatile Interferometer for Shop Use," Proc. SPIE, 192, 13 (1979).
-
(1979)
Proc. SPIE
, vol.192
, pp. 13
-
-
Smith, W.S.1
-
30
-
-
0042057158
-
Spherical Aberration in the Fizeau Interferometer
-
Taylor W. G. A., "Spherical Aberration in the Fizeau Interferometer," J. Sci. Instrum., 34, 399 (1957).
-
(1957)
J. Sci. Instrum.
, vol.34
, pp. 399
-
-
Taylor, W.G.A.1
-
31
-
-
0040964606
-
Absolute Interferometric Testing of Spherical Surfaces
-
Truax B. E., "Absolute Interferometric Testing of Spherical Surfaces," Proc. SPIE, 966, 130 (1988).
-
(1988)
Proc. SPIE
, vol.966
, pp. 130
-
-
Truax, B.E.1
-
32
-
-
3142699347
-
Joint Interferometric Measurement of Planarity and Parallelism
-
Vannoni M. and G. Molezini, "Joint Interferometric Measurement of Planarity and Parallelism," Opt. Eng., 43, 1215-1220 (2004).
-
(2004)
Opt. Eng.
, vol.43
, pp. 1215-1220
-
-
Vannoni, M.1
Molezini, G.2
-
33
-
-
0015126147
-
Measurement of Parallelism of the Surfaces of a Transparent Sample Using Two Beam Nonlocalized Fringes Produced by Laser
-
Wasilik H., T. V. Biomquist, and C. S.Willet, "Measurement of Parallelism of the Surfaces of a Transparent Sample Using Two Beam Nonlocalized Fringes Produced by Laser," Appl.Opt., 10, 2107 (1971).
-
(1971)
Appl.Opt.
, vol.10
, pp. 2107
-
-
Wasilik, H.1
Biomquist, T.V.2
Willet, C.S.3
-
34
-
-
84975602271
-
Fringe Localization
-
Wyant J. C., "Fringe Localization," Appl. Opt., 17, 1853 (1978).
-
(1978)
Appl. Opt.
, vol.17
, pp. 1853
-
-
Wyant, J.C.1
-
35
-
-
84955067453
-
Design of a CompactWide Aperture Fizeau Interferometer
-
Yoder P. R., Jr. and W.W. Hollis, "Design of a CompactWide Aperture Fizeau Interferometer," J. Opt. Soc. Am., 47, 858 (1957).
-
(1957)
J. Opt. Soc. Am.
, vol.47
, pp. 858
-
-
Yoder, P.R.Jr.1
Hollis, W.W.2
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