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Volumn 4, Issue 4, 2015, Pages 297-309

Performance of 100-W HVM LPP-EUV source

Author keywords

13.5 nm; carbon dioxide (CO2) laser; extreme ultraviolet (EUV) light source; high volume manufacturing (HVM); laser produced plasma (LPP); lithography; tin (Sn)

Indexed keywords


EID: 84941641549     PISSN: 21928576     EISSN: 21928584     Source Type: Journal    
DOI: 10.1515/aot-2015-0025     Document Type: Review
Times cited : (9)

References (27)
  • 7
    • 84941677548 scopus 로고    scopus 로고
    • ASML EUV Technology Roadmap Accessed on May
    • ASML, EUV Technology Roadmap, http://www.asml.com/doclib/misc/asml-20140306-EUV
    • (2015) , vol.22
  • 22
    • 84941625134 scopus 로고    scopus 로고
    • (October 2012, Brussel
    • Y. Tanino, in EUV Symposium 2012 (October 1-4, 2012, Brussel).
    • (2012) EUV Symposium , pp. 1-4
    • Tanino, Y.1
  • 26
    • 84941677560 scopus 로고    scopus 로고
    • RIGAKU technical display, in (October 2013,Toyama
    • RIGAKU technical display, in EUV Symposium 2013 (October 6-10, 2013,Toyama).
    • EUV Symposium , vol.2013 , pp. 6-10
  • 27
    • 84941645589 scopus 로고    scopus 로고
    • (October 2012, Brussel
    • H. Mizoguchi, in EUV Symposium 2012 (October 1-4, 2012, Brussel).
    • (2012) EUV Symposium , pp. 1-4
    • Mizoguchi, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.