Density functional studies on edge-contacted single-layer MoS2 piezotronic transistors

Applied Physics Letters

Volumn 107, Issue 8, 2015, Pages

  Liu, Wei ^a   Zhang, Aihua ^a   Zhang, Yan ^a,b   Wang, Zhong Lin ^a,c  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b LANZHOU UNIVERSITY   (China)

^c Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; INTERFACE STATES; MOLYBDENUM COMPOUNDS; PIEZOELECTRICITY; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; TRANSISTORS;

DENSITY FUNCTIONAL THEORY SIMULATIONS; DENSITY-FUNCTIONAL STUDY; FIRST-PRINCIPLES CALCULATION; INTERFACE STRUCTURES; METALLIC STATE; PIEZOELECTRIC CHARGE; PIEZOELECTRIC SEMICONDUCTORS; SCREENING EFFECT;

DENSITY FUNCTIONAL THEORY;

EID: 84940472815     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4929726     Document Type: Article

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