Morphology-controlled synthesis, characterization and microwave absorption properties of nanostructured 3D CeO2

Materials Science in Semiconductor Processing

Volumn 41, Issue , 2016, Pages 6-11

  Wu, Guanglei ^a   Cheng, Yonghong ^a   Xiang, Feng ^a   Jia, Zirui ^a   Xie, Qian ^a   Wu, Gaoqing ^a   Wu, Hongjing ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

CeO2; Dielectric loss; Microwave absorption

Indexed keywords

COMPLEX NETWORKS; DIELECTRIC LOSSES; ELECTRIC NETWORK ANALYZERS; ENAMELS; FIELD EMISSION MICROSCOPES; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

COMPLEX PERMITTIVITY AND PERMEABILITIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HYDROTHERMAL TECHNIQUES; INTRINSIC CHARACTERISTICS; MICROWAVE ABSORPTION; MICROWAVE ABSORPTION PROPERTIES; MORPHOLOGY-CONTROLLED; VECTOR NETWORK ANALYZERS;

THERMOGRAVIMETRIC ANALYSIS;

EID: 84940176270     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2015.06.077     Document Type: Article

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