Two-Step Annealing Study of Cuprous Oxide for Photovoltaic Applications

IEEE Journal of Photovoltaics

Volumn 5, Issue 5, 2015, Pages 1476-1481

  Lloyd, Michael A ^a   Siah, Sin Cheng ^a   Brandt, Riley E ^a   Serdy, James ^a   Johnston, Steve W ^b   Hofstetter, Jasmin ^a   Lee, Yun Seog ^a   McCandless, Brian ^c   Buonassisi, Tonio ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c UNIVERSITY OF DELAWARE   (United States)

Author keywords

Annealing; charge carrier density; charge carrier mobility; copper compounds; photoconductivity; photovoltaic cells; X ray diffraction

Indexed keywords

ANNEALING; CHARGE CARRIERS; COPPER COMPOUNDS; HALL MOBILITY; PHOTOCONDUCTIVITY; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; SOLAR CELLS; X RAY DIFFRACTION;

ANNEALING TEMPERATURES; CARRIER RECOMBINATION; NITROGEN ANNEALING; PHOTOVOLTAIC APPLICATIONS; POSTGROWTH ANNEALING; PROCESSING WINDOWS; SOLAR CELL DEVICES; TWO-STEP ANNEALING;

CARRIER CONCENTRATION;

EID: 84940048687     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2015.2455332     Document Type: Article

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