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1
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85066743324
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A verified proton induced latch-up in space
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IEEE NSREC 92
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The behaviour of measured SEU at low altitude during periods of high solar activity
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Dec.'90
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R. Harboe Sorensen, E. J. Daly, C. I. Underwood, J. Ward and L. Adams, "The Behaviour of Measured SEU at Low Altitude During Periods of High Solar Activity". IEEE Trans, on Nucl. Sci., NS-37, No 6, Dec.'90, pp 1938-43.
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Harboe Sorensen, R.1
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3
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0026390650
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High energy proton SEU test results for the commercially available R3000 microprocessor and R3010 floating point unit
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Dec.'91
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D. L. Shaeffer, N. J. Colella, R. W. Davis, S. M. Denton, J. L. Kaschmitter, J. R. Kimbrough, J. W. Wilburn and D. Holtkamp, "High Energy Proton SEU Test Results for the Commercially Available R3000 Microprocessor and R3010 Floating Point Unit", IEEE Trans, on Nucl. Sci., NS-38, No 6, Dec.'91, pp 1421-28.
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J. L. Kaschmitter, D. L. Shaeffer, N. J. Colella, C. L. McKnett and P. G. Coakley, "Operation of Commercial R3000 Processors in the Low Earth Orbit (LEO) Space Environment" IEEE Trans, on Nucl. Sci., NS-38, No 6, Dec.'91, pp 1415-20.
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85066752433
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R3000 Heavy Ion Tests Conducted by Lawrence Livermore National Laboratory Personnel at the Los Alamos National Laboratory Ion Beam Facility, February 12-15, 1991, Report to be published in 1991
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R3000 Heavy Ion Tests Conducted by Lawrence Livermore National Laboratory Personnel at the Los Alamos National Laboratory Ion Beam Facility, February 12-15, 1991, Report to be published in 1991.
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7
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A comparison of heavy ion sources used in cosmic ray simulation studies of VLSI circuits
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J. H. Stephen, T. K. Sanderson, D. Mapper, J. Farren, R. Harboe Sorensen and L. Adams, "A Comparison of Heavy Ion Sources Used in Cosmic Ray Simulation Studies of VLSI Circuits". IEEE Trans, on Nucl. Sci., NS-31, No 6, Dec.'84, pp 1069-72.
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Measurements of proton upset induced in CMOS devices: Synthesis of CEA studies
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Cosmic ray effects on microelectronics, part IV
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J. H. Adams Jr, "Cosmic Ray Effects on Microelectronics, Part IV". NRL Memorandum Report 5901 (1986).
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The SEU risk assessment of Z80A, 8086 and 80C86 microprocessors intended for use in a low altitude polar orbit
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Dec'86
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R. Harboe Sorensen, L. Adams, E. J. Daly, C. Sansoe, D. Mapper and T. K. Sanderson, "The SEU Risk Assessment of Z80A, 8086 and 80C86 Microprocessors Intended for Use in a Low Altitude Polar Orbit". Trans, on Nucl. Sci., NS-33, No 6, Dec'86, pp 1626-31.
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AP8 trapped proton environment for solar maximum and minimum
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