Operation of Commercial R3000 Processors in the Low Earth Orbit (LEO) Space Environment

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1415-1420

  McKnett, C L ^b   Coakley, P G ^b   Colella, N J ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b TITAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; PROTONS; SPACECRAFT;

LOW EARTH ORBIT; R3000 PROCESSORS;

COMPUTERS, MICROCOMPUTER;

EID: 0026385424     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124126     Document Type: Article

References (12)

1. J. H. Adams, Jr., “Cosmic Ray Effects on Microelectronics, Part IV,” NRL Memorandum Report, 5901 (1986).
2. E. Petersen, “Single Event Upsets in Space,” Tutorial Notes, IEEE Short Course (17 July, 1983).
3. J. L. Kaschmitter, F. E. Rubarth, L. H. Capots, and W. S. Scott, “Wafer Scale RISC Processor,” Government Microcircuit Applications Conference (GOMAC), Vol. XV, Session 2.6, page 27 (1989).
4. A. T. Barfknecht, D. B. Tuckerman, J. L. Kaschmitter, and B. M. McWilliams, “Multichip Packaging Technology with Laser-Patterned Interconnects” Multichip Modules, System Advantages, Major Constructions and Materials Technologies, pg. 162, IEEE Press (1991).
5. E. G. Stassinopoulos and J. M. Barth, “Transport and Shielding Analysis of the Non-Equitorial Terrestrial Low Altitude Charged Particle Radiation Environment, Volume 1: Solar Minimum,” NASA X-601-84-6, NASA Goddard Space Flight Center (January 1984).
6. J. R. Letaw, author: SPACE RADIATION CODE, Severn Communications Corp., Millersville, MD (1990).
7. D. L. Shaeffer, N. J. Colella, R. W. Davis, S. M. Denton, J. L. Kaschmitter, J. R. Kimbrough, J. W. Wilburn, and D. Holtkamp, “High Energy Proton SEU Test Results for the Commercially Available R3000 Microprocessor and R3010 Floating Point Unit,” submitted for publication in IEEE Transactions on Nuclear Science, Vol 2 (December 1991).
8. J. S. Browning, “Results of the Proton Beam Tests of the DMS Board Components at LAMPF WNR,” Sandia Internal Report (July 9, 1990).
9. J. H. Adams, Jr., “The Variability of Single Event Upset Rates in the Natural Environment,” IEEE Transactions on Nuclear Science, Vol NS-30, No. 6 (December, 1983).
10. D. Vail, “Estimating the On-Orbit Single Event Upset Behavior of a MIPS R3000 Microprocessor,” Harris Corporation Internal Paper (February, 1991).
11. L. Vainsecher, and M. Gavrielov, LSI Logic Inc., personal communication.
12. B. Randell, P. Lee, and P. Treleaven “Reliability Issues in Computing System Design,” Comput. Surv. 10, 2, 123–164 (June 1978).