The seu risk assessment of Z80A, 8086 and 80C86 microprocessors intended for use in a low altitude polar orbit

IEEE Transactions on Nuclear Science

Volumn 33, Issue 6, 1986, Pages 1626-1631

  Harboe Sorensen R ^a   Adams, L ^a   Daly, E J ^a   Sansoe, C ^a   Mapper, D ^b   Sanderson, T K ^b  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b CULHAM SCIENCE CENTRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346448427     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1986.4334653     Document Type: Article

References (10)

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3. J.H. Adams Jr., “Tools for Estimating Single Event Upset Rates”, Private communications to be published, (See also NRL memorandum reports, 4506, 5099, 5364 and 5864).
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