Chemical Force Spectroscopy Evidence Supporting the Layer-by-Layer Model of Organic Matter Binding to Iron (oxy)Hydroxide Mineral Surfaces

Environmental Science and Technology

Volumn 49, Issue 16, 2015, Pages 9733-9741

  Chassé, Alexander W ^a   Ohno, Tsutomu ^a   Higgins, Steven R ^c   Amirbahman, Aria ^b   Yildirim, Nadir ^a   Parr, Thomas B ^d  

^a UNIVERSITY OF MAINE   (United States)

^b University of Maine   (United States)

^c WRIGHT STATE UNIVERSITY   (United States)

^d UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; BIOGEOCHEMISTRY; BIOLOGICAL MATERIALS; ELECTROSPRAY IONIZATION; FOURIER SERIES; MASS SPECTROMETRY; MOLECULES; NEGATIVE IONS; ORGANIC COMPOUNDS; SOILS; STABILIZATION; SURFACE DEFECTS;

ADSORPTION PROCESS; DISSOLVED ORGANIC MATTERS; EQUILIBRIUM STUDY; FOURIER TRANSFORM ION CYCLOTRON RESONANCE MASS SPECTROMETRY; HYDROXIDE MINERALS; LAYER-BY LAYER MODEL; MINERAL SURFACES; ULTRAHIGH RESOLUTION;

MINERALS;

AROMATIC CARBOXYLIC ACID; CARBOXYL GROUP; DISSOLVED ORGANIC MATTER; FERRIC HYDROXIDE; MICROSPHERE; SILICON DIOXIDE; HYDROXIDE; IRON; MINERAL; ORGANIC COMPOUND;

CARBON SEQUESTRATION; CONCEPTUAL FRAMEWORK; DISSOLVED ORGANIC MATTER; EQUILIBRIUM; IRON HYDROXIDE; MINERAL PROCESSING; MOLECULAR ANALYSIS;

ACID DISSOCIATION CONSTANT; ACIDITY; ADHESION; ADSORPTION; ARTICLE; CARBON CYCLE; CARBON SEQUESTRATION; CHEMICAL COMPOSITION; CHEMICAL FORCE SPECTROSCOPY; COMPLEX FORMATION; FOREST SOIL; HISTOGRAM; ION CYCLOTRON RESONANCE MASS SPECTROMETRY; IONIC STRENGTH; ISOTHERM; METAL BINDING; MOLECULAR WEIGHT; NEGATIVE ION ELECTROSPRAY; PH; POTENTIOMETRIC TITRATION; SOLID PHASE EXTRACTION; SPECTROSCOPY; STRENGTH; SURFACE CHARGE; SURFACE PROPERTY; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; MASS SPECTROMETRY; PROCEDURES;

ALLIUM CEPA;

ADSORPTION; HYDROXIDES; IRON; MASS SPECTROMETRY; MICROSCOPY, ATOMIC FORCE; MINERALS; MODELS, CHEMICAL; MOLECULAR WEIGHT; ORGANIC CHEMICALS; SPECTRUM ANALYSIS;

EID: 84939638662     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/acs.est.5b01877     Document Type: Article

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