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Volumn 581, Issue , 2015, Pages 49-53

Validation methods for low-resolution fitting of atomic structures to electron microscopy data

Author keywords

Electron microscopy; Fitting; Validation

Indexed keywords

AMINO TERMINAL SEQUENCE; ARTICLE; ATOM; CONFIDENCE INTERVAL; CRYOELECTRON MICROSCOPY; IMAGE RECONSTRUCTION; MEASUREMENT ACCURACY; MEASUREMENT ERROR; PRIORITY JOURNAL; VALIDATION PROCESS; CHEMICAL STRUCTURE; PROCEDURES; STRUCTURE ACTIVITY RELATION; TRENDS;

EID: 84939268213     PISSN: 00039861     EISSN: 10960384     Source Type: Journal    
DOI: 10.1016/j.abb.2015.06.017     Document Type: Article
Times cited : (5)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.