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Volumn 110, Issue 22, 2013, Pages 8930-8935

Cross-validation in cryo-EM-based structural modeling

Author keywords

Flexible fitting; Real space structure refinement

Indexed keywords

ARTICLE; CONTROLLED STUDY; DENSITY; MOLECULAR MODEL; PRIORITY JOURNAL; SIGNAL NOISE RATIO; VALIDATION PROCESS; X RAY DIFFRACTION;

EID: 84878465198     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1119041110     Document Type: Article
Times cited : (40)

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