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Volumn 5, Issue 12, 2014, Pages 4213-4222

Enhanced quantitative phase imaging in selfinterference digital holographic microscopy using an electrically focus tunable lens

Author keywords

[No Author keywords available]

Indexed keywords

HOLOGRAPHY; MICROLENSES; MICROSCOPIC EXAMINATION; PHASE MEASUREMENT;

EID: 84938785930     PISSN: None     EISSN: 21567085     Source Type: Journal    
DOI: 10.1364/BOE.5.004213     Document Type: Article
Times cited : (37)

References (37)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.