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Volumn 21, Issue 5, 2013, Pages 5701-5714

Compact and portable low-coherence interferometer with off-axis geometry for quantitative phase microscopy and nanoscopy

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; OPTICAL TESTING;

EID: 84875204586     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.005701     Document Type: Article
Times cited : (172)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.