Allelic variation at the vernalization and photoperiod sensitivity loci in Chinese winter wheat cultivars (Triticum aestivum L.)

Frontiers in Plant Science

Volumn 6, Issue JULY, 2015, Pages 1-10

  Zhang, Xiangfen ^a,b,c   Gao, Manxia ^c   Wang, Shasha ^a,b,c   Chen, Feng ^a,b,c   Cui, Dangqun ^a,b,c  

^a Key Laboratory of Wheat and Maize Crop Science   (China)

^b National Key Laboratory of Wheat and Maize Crop Science   (China)

^c HENAN AGRICULTURAL UNIVERSITY   (China)

Author keywords

Allelic variation; Bread wheat; Copy number variations; Photoperiod genes; Vernalization genes

Indexed keywords

TRITICUM AESTIVUM;

EID: 84936945478     PISSN: None     EISSN: 1664462X     Source Type: Journal    
DOI: 10.3389/fpls.2015.00470     Document Type: Article

References (34)

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