Influence of finite spatial coherence on ptychographic reconstruction

Applied Physics Letters

Volumn 107, Issue 1, 2015, Pages

  Stachnik, K ^a   Mohacsi, I ^b   Vartiainen, I ^b   Stuebe, N ^a   Meyer, J ^a   Warmer, M ^a   David, C ^b   Meents, A ^a  

^a DESY   (Germany)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; IMAGING TECHNIQUES; X RAY OPTICS;

COHERENT DIFFRACTIVE IMAGING; COHERENT ILLUMINATION; PARTIALLY COHERENT; QUANTITATIVE MEASUREMENT; RECONSTRUCTED IMAGE; SIMULTANEOUS RECONSTRUCTION; SPATIAL RESOLUTION; ULTRAHIGH RESOLUTION;

IMAGE RECONSTRUCTION;

EID: 84935500389     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4926328     Document Type: Article

References (26)

1. B. Kaulich, P. Thibault, A. Gianoncelli, and M. Kiskinova, J. Phys.: Condens. Matter 23, 083002 (2011). 10.1088/0953-8984/23/8/083002
2. G. Schmahl, D. Rudolph, P. Guttmann, G. Schneider, J. Thieme, and B. Niemann, Rev. Sci. Instrum. 66, 1282 (1995). 10.1063/1.1145955
3. Y. S. Chu, J. M. Yi, F. De Carlo, Q. Shen, W.-K. Lee, H. J. Wu, C. L. Wang, J. Y. Wang, C. J. Liu, C. H. Wang, S. R. Wu, C. C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K. S. Liang, C. S. Yang, J. H. Je, and G. Margaritondo, Appl. Phys. Lett. 92, 103119 (2008). 10.1063/1.2857476
4. I. Vartiainen, M. Warmer, D. Goeries, E. Herker, R. Reimer, C. David, and A. Meents, J. Synchrotron Radiat. 21, 790 (2014). 10.1107/S1600577514010388
5. J. R. Fienup, Appl. Opt. 21, 2758 (1982). 10.1364/AO.21.002758
6. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, Nature 400, 342 (1999). 10.1038/22498
7. R. Hegerl and W. Hoppe, Ber. Bunsen-Ges. Phys. Chem. 74, 1148 (1970). 10.1002/bbpc.19700741112
8. J. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, Phys. Rev. Lett. 98, 034801 (2007). 10.1103/PhysRevLett.98.034801
9. O. Bunk, M. Dierolf, S. Kynde, I. Johnson, O. Marti, and F. Pfeiffer, Ultramicroscopy 108, 481 (2008). 10.1016/j.ultramic.2007.08.003
10. M. Guizar-Sicairos and J. R. Fienup, Opt. Express 16, 7264 (2008). 10.1364/OE.16.007264
11. P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009). 10.1016/j.ultramic.2008.12.011
12. A. M. Maiden and J. M. Rodenburg, Ultramicroscopy 109, 1256 (2009). 10.1016/j.ultramic.2009.05.012
13. K. Giewekemeyer, P. Thibault, S. Kalbfleisch, A. Beerlink, C. M. Kewish, M. Dierolf, F. Pfeiffer, and T. Salditt, Proc. Natl. Acad. Sci. U. S. A. 107, 529 (2010). 10.1073/pnas.0905846107
14. J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, Opt. Express 19, 21333 (2011). 10.1364/OE.19.021333
15. A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, Appl. Phys. Lett. 100, 253112 (2012). 10.1063/1.4729942
16. P. Thibault and A. Menzel, Nature 494, 68 (2013). 10.1038/nature11806
17. A. Meents, B. Reime, N. Stuebe, P. Fischer, M. Warmer, D. Goeries, J. Roever, J. Meyer, J. Fischer, A. Burkhardt, I. Vartiainen, P. Karvinen, and C. David, Proc. SPIE 8851, 88510 K (2013). 10.1117/12.2027303
18. F. van der Veen and F. Pfeiffer, J. Phys.: Condens. Matter 16, 5003 (2004). 10.1088/0953-8984/16/28/020
19. B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, Nucl. Instrum. Methods Phys. Res., Sect. A 607, 247 (2009). 10.1016/j.nima.2009.03.200
20. V. Elser, J. Opt. Soc. Am. A 20, 40 (2003). 10.1364/JOSAA.20.000040
21. S. Gorelick, J. Vila-Comamala, V. A. Guzenko, and C. David, Microelectron. Eng. 88, 2259 (2011). 10.1016/j.mee.2011.02.094
22. For spokes' edges at angles between 3° and 43° with respect to the horizontal direction (white solid line), the vertical profiles were considered (blue lines), whereas for the steeper angles (53°-93°) the horizontal profiles (orange lines) were chosen. Taking only horizontal and vertical profiles prevented interpolation of pixels.
23. Error bars of FWHM tot represent standard uncertainties.
24. B. Enders, M. Dierolf, P. Cloetens, M. Stockmar, F. Pfeiffer, and P. Thibault, Appl. Phys. Lett. 104, 171104 (2014). 10.1063/1.4874304
25. The PSD was obtained by taking a discrete Fourier transform of a real space image. A one-parameter Kaiser-Bessel window function (parameter's value: 4) was used. The 2D PSD was then azimuthally averaged being thus transformed into a 1D curve.
26. P. Thibault, M. Guizar-Sicairos, and A. Menzel, J. Synchrotron Radiat. 21, 1011 (2014). 10.1107/S1600577514015343