Application of a 2-beam model for improving the structure factors from precession electron diffraction intensities

Ultramicroscopy

Volumn 107, Issue 6-7, 2007, Pages 543-550

  Sinkler, Wharton ^a   Own, Christopher S ^b   Marks, Laurence D ^b  

^a UOP LLC   (United States)

^b Northwestern University   (United States)

Author keywords

Electron crystallography; Precession electron diffraction; Zeolite

Indexed keywords

APPROXIMATION THEORY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; MATHEMATICAL MODELS; ZEOLITES;

ELECTRON CRYSTALLOGRAPHY; KINEMATICAL APPROXIMATION; PRECESSION ELECTRON DIFFRACTION (PED);

ELECTRON BEAMS;

ALLOY; GALLIUM; INDIUM; OXIDE; TIN DERIVATIVE; ZEOLITE;

ACCURACY; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; KINEMATICS; MATERIALS TESTING; STRUCTURE ANALYSIS;

EID: 33847154954     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.02.008     Document Type: Article

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