A fast and reliable readout method for quantitative analysis of surface-enhanced Raman scattering nanoprobes on chip surface

Review of Scientific Instruments

Volumn 86, Issue 5, 2015, Pages

  Chang, Hyejin ^a   Kang, Homan ^a,c   Jeong, Sinyoung ^a   Ko, Eunbyeol ^a   Lee, Yoon Sik ^a   Lee, Ho Young ^b   Jeong, Dae Hong ^a  

^a Seoul National University   (South Korea)

^b Seoul National University Bundang Hospital   (South Korea)

^c HARVARD MEDICAL SCHOOL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTIPLEXING; RAMAN SCATTERING; SIGNAL TO NOISE RATIO;

HIGH SENSITIVITY; KEY TECHNOLOGIES; MEASUREMENT TIME; MULTIPLEXED DETECTION; QUANTITATIVE MEASUREMENT; SCANNING METHODS; SIGNAL FLUCTUATIONS; SURFACE ENHANCED RAMAN SCATTERING (SERS);

SURFACE SCATTERING;

NANOMATERIAL;

CHEMISTRY; DEVICES; IMMUNOASSAY; PROCEDURES; RAMAN SPECTROMETRY; SIGNAL NOISE RATIO; VALIDATION STUDY;

IMMUNOASSAY; NANOSTRUCTURES; SIGNAL-TO-NOISE RATIO; SPECTRUM ANALYSIS, RAMAN;

EID: 84929645876     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4921100     Document Type: Article

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