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Volumn 3, Issue 19, 2015, Pages 10498-10503
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Atomic layer deposition of epitaxial CeO2 thin layers for faster surface hydrogen oxidation and faster bulk ceria reduction/reoxidation
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC LAYER DEPOSITION;
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;
HYDROGEN;
REDUCTION;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
SOLID OXIDE FUEL CELLS (SOFC);
SUBSTRATES;
TEMPERATURE;
X RAY DIFFRACTION ANALYSIS;
YTTRIA STABILIZED ZIRCONIA;
EIS MEASUREMENTS;
ELECTROCHEMICAL CHARACTERIZATIONS;
HIGH RESOLUTION X RAY DIFFRACTION;
HYDROGEN ATMOSPHERE;
HYDROGEN OXIDATION;
LOW TEMPERATURE ANNEALING;
PROCESS ORIENTATION;
SINGLE CRYSTAL SUBSTRATES;
CERIUM OXIDE;
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EID: 84928939698
PISSN: 20507488
EISSN: 20507496
Source Type: Journal
DOI: 10.1039/c5ta00861a Document Type: Article |
Times cited : (11)
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References (14)
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