Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films

Applied Physics Letters

Volumn 105, Issue 7, 2014, Pages

  Paulauskas, T ^a   Buurma, C ^a   Colegrove, E ^a   Guo, Z ^a   Sivananthan, S ^a   Chan, M K Y ^b   Klie, R F ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CADMIUM CHLORIDE; CADMIUM TELLURIDE; CALCULATIONS; CHLORINE COMPOUNDS; CRYSTALLINE MATERIALS; DENSITY FUNCTIONAL THEORY; DEPOSITION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; II-VI SEMICONDUCTORS; POINT DEFECTS; STOICHIOMETRY; THIN FILM CIRCUITS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; DEVICE PERFORMANCE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORY; HIGH-ANGLE ANNULAR DARK-FIELD IMAGING; NATIVE POINT DEFECTS; POST DEPOSITION ANNEALING; SCANNING TRANSMISSION ELECTRON MICROSCOPES;

THIN FILMS;

EID: 84928575514     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4893727     Document Type: Article

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