Recording and using 4D-STEM datasets in materials science

Microscopy and Microanalysis

Volumn 20, Issue 3, 2014, Pages 62-63

  Ophus, Colin ^a   Ercius, Peter ^a   Sarahan, Michael ^b   Czarnik, Cory ^b   Ciston, Jim ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84927949312     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614002037     Document Type: Conference Paper

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5. AX Gray, J Minár, L Plucinski et al., Europhysics Letters 104 (2013) 17004.
6. JM LeBeau, SD Findlay, LJ Allen and S Stemmer, Ultramicroscopy 110 (2010) p. 118.
7. EJ Kirkland, Advanced Computing in Electron Microscopy 2nd Edition (2010) Springer.