Interfacial water dielectric-permittivity-profile measurements using atomic force microscopy

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 64, Issue 1, 2001, Pages 10-

  Teschke, O ^a   Ceotto, G ^b   de Souza, E F ^c  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b FEDERAL UNIVERSITY OF VIÇOSA   (Brazil)

^c PONTIFÍCIA UNIVERSIDADE CATÓLICA DE CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84927591405     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.64.011605     Document Type: Article

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