Investigation of Cu-poor and Cu-rich Cu(In,Ga)Se2/CdS interfaces using hard X-ray photoelectron spectroscopy

Thin Solid Films

Volumn 582, Issue , 2015, Pages 366-370

  Umsur B ^a   Calvet, W ^a   Hopfner B ^a   Steigert, A ^a   Lauermann, I ^a   Gorgoi, M ^a   Prietzel, K ^a   Navirian, H A ^a   Kaufmann, C A ^a   Unold, T ^a   Lux Steiner, M Ch ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Cd diffusion; Chalcopyrite; Hard; Interface; X ray photoelectron spectroscopy

Indexed keywords

BUFFER LAYERS; CADMIUM; CADMIUM METALLOGRAPHY; CADMIUM SULFIDE; COPPER COMPOUNDS; COPPER METALLOGRAPHY; EMISSION SPECTROSCOPY; II-VI SEMICONDUCTORS; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

CD DIFFUSION; CHALCOPYRITE; CHEMICAL-BATH DEPOSITION; ELEVATED TEMPERATURE; HARD; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HEATING TREATMENTS; NEAR-SURFACE COMPOSITIONS;

SULFUR COMPOUNDS;

EID: 84926443346     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2014.08.049     Document Type: Conference Paper

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