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Volumn 26, Issue 3, 2008, Pages 901-903

Microscopic investigation of the CdS buffer layer growth on Cu (In,Ga) Se2 absorbers

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BUFFER LAYERS; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; GRAIN GROWTH;

EID: 44649115092     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2902859     Document Type: Article
Times cited : (3)

References (11)
  • 5
    • 0033897028 scopus 로고    scopus 로고
    • THSFAP 0040-6090.
    • T. Nakada, Thin Solid Films THSFAP 0040-6090 361-362, 346 (2000).
    • (2000) Thin Solid Films , vol.361-362 , pp. 346
    • Nakada, T.1
  • 10
    • 0035894344 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.64.241304.
    • J. E. Jaffe and A. Zunger, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.241304 64, 241304 (2001).
    • (2001) Phys. Rev. B , vol.64 , pp. 241304
    • Jaffe, J.E.1    Zunger, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.