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Nano Letters

Volumn 15, Issue 3, 2015, Pages 2050-2054

Confining crack propagation in defective graphene

(3) López Polín, Guillermo a Gómez Herrero, Julio a,b Gómez Navarro, Cristina a,b

a UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

b Ciudad Universitaria de Cantoblanco (Spain)

Author keywords

atomic force microscopy; crack propagation; defects; Graphene; toughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; CRACKS; DEFECTS; FAILURE (MECHANICAL); TOUGHNESS;

CATASTROPHIC FAILURES; DEFECT CONTENTS; DEFECT CREATION; GRAPHENE OXIDES; INDUCED DEFECTS; MECHANICAL FAILURES; SYSTEMATIC STUDY;

GRAPHENE;

EID: 84924530042 PISSN: 15306984 EISSN: 15306992 Source Type: Journal
DOI: 10.1021/nl504936q Document Type: Article

Times cited : (75)

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