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Volumn 103, Issue 46, 1999, Pages 10081-10086

An X-ray Absorption Spectroscopy Study of the Ni K Edge in NiO-SiO2 Nanocomposite Materials Prepared by the Sol-Gel Method

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000857008     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9927911     Document Type: Article
Times cited : (51)

References (28)
  • 15
    • 0004041818 scopus 로고    scopus 로고
    • CCLRC Daresbury Laboratory computer program
    • Binsted N. EXCURV98; CCLRC Daresbury Laboratory computer program, 1998.
    • (1998) EXCURV98
    • Binsted, N.1
  • 25
    • 33645931201 scopus 로고    scopus 로고
    • private communication.
    • Bruni, S., private communication.
    • Bruni, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.