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Volumn 5, Issue , 2015, Pages

Sub-wavelength terahertz beam profiling of a THz source via an all-optical knife-edge technique

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EID: 84923675706     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep08551     Document Type: Article
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.