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Volumn 90, Issue 11, 2014, Pages

Resistance of helical edges formed in a semiconductor heterostructure

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EID: 84922860740     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.90.115309     Document Type: Article
Times cited : (179)

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