Ripplocations in van der Waals layers

Nano Letters

Volumn 15, Issue 2, 2015, Pages 1302-1308

  Kushima, Akihiro ^a   Qian, Xiaofeng ^a   Zhao, Peng ^b   Zhang, Sulin ^a,b   Li, Ju ^a  

^a Massachusetts Institute of Technology   (United States)

^b The Pennsylvania State University   (United States)

Author keywords

2D layered crystals; dislocation; MoS2; ripple; van der Waals homostructures

Indexed keywords

BURGERS VECTOR; IN SITU PROCESSING; MOLYBDENUM COMPOUNDS; SURFACE DEFECTS; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES;

DEFECT ENGINEERING; HOMOSTRUCTURES; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; LAYERED CRYSTALS; MOS2; RIPPLE; THREE-DIMENSIONAL CRYSTALS; TOPOLOGICAL LINES;

DISLOCATIONS (CRYSTALS);

EID: 84922776884     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl5045082     Document Type: Article

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