Detection of ion adsorption at solid-liquid interfaces using internal reflection ellipsometry

Sensors and Actuators, B: Chemical

Volumn 210, Issue , 2015, Pages 649-655

  Wang, Lei ^a   Zhao, Cunlu ^a   Duits, Michel H G ^a   Mugele, Frieder ^a   Siretanu, Igor ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Electric double layer; Internal reflection ellipsometry; Ion adsorption; Surface complexation reactions

Indexed keywords

ADSORPTION; CALCIUM; CHLORINE COMPOUNDS; COMPLEXATION; ELECTROCHEMISTRY; ELLIPSOMETRY; EQUILIBRIUM CONSTANTS; IONS; SURFACE REACTIONS;

ELECTRIC DOUBLE LAYER; INTERNAL REFLECTION ELLIPSOMETRY; ION ADSORPTION; PREFERENTIAL ADSORPTION; SILICA-WATER INTERFACE; SOLID-LIQUID INTERFACES; SURFACE COMPLEXATION MODELING; SURFACE COMPLEXATION REACTIONS;

PHASE INTERFACES;

EID: 84921945655     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2014.12.127     Document Type: Article

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