Highly-sensitive reflectometry setup capable of probing the electrical double layer on silica

Sensors and Actuators, B: Chemical

Volumn 151, Issue 1, 2010, Pages 250-255

  Porus, Maria ^a   Maroni, Plinio ^a   Borkovec, Michal ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

Double layer; Lock in detection; Reflectometry

Indexed keywords

BASIC STERN; DETECTION LIMITS; DOUBLE LAYERS; ELECTRICAL DOUBLE LAYERS; HE-NE LASERS; HIGH SENSITIVITY; LIQUID/SOLID INTERFACE; LOCK-IN DETECTION; OPTICAL REFLECTOMETRY; OPTICAL SURFACES; QUANTITATIVE INTERPRETATION; REFLECTOMETRY; REFRACTIVE INDEX INCREMENT; SINGLE-ION;

ADSORPTION; ELECTRIC PROPERTIES; NEON; QUARTZ; REFLECTION; REFRACTIVE INDEX; SILICA; SURFACE PLASMON RESONANCE;

REFLECTOMETERS;

EID: 78049439471     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2010.09.010     Document Type: Article

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