Structural, Raman spectroscopic and microwave dielectric studies on Ni1-x(Zn1/2Zr1/2)xW1-xNbxO4 ceramic compounds with wolframite structure

Dalton Transactions

Volumn 44, Issue 5, 2015, Pages 2311-2324

  Ramarao, S D ^a   Murthy, V R K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DIELECTRIC PROPERTIES; ELECTRONEGATIVITY; NATURAL FREQUENCIES; NICKEL; RAMAN SPECTROSCOPY; RIETVELD REFINEMENT; SOLID STATE REACTIONS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZIRCONIUM;

CHEMICAL BONDING STATE; ELECTRONEGATIVITY DIFFERENCE; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; POWDER X RAY DIFFRACTION; SOLID STATE REACTION METHOD; SPECTROSCOPIC MEASUREMENTS; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

STRUCTURE (COMPOSITION);

EID: 84921674952     PISSN: 14779226     EISSN: 14779234     Source Type: Journal    
DOI: 10.1039/c4dt02364a     Document Type: Article

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